{"product_id":"test-generation-of-crosstalk-delay-faults-in-vlsi-circuits-9789811324932","title":"Test Generation of Crosstalk Delay Faults in VLSI Circuits","description":"\u003cp\u003eThis book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.\u003c\/p\u003e","brand":"Gardners","offers":[{"title":"Default Title","offer_id":53646404190487,"sku":null,"price":14951.84,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0679\/6918\/8119\/files\/9789811324932.jpg?v=1783507039","url":"https:\/\/payment.letskitaboo.com\/products\/test-generation-of-crosstalk-delay-faults-in-vlsi-circuits-9789811324932","provider":"Kitaboo One eStore","version":"1.0","type":"link"}