{"product_id":"vlsi-design-and-test-9789811074707","title":"VLSI Design and Test","description":"\u003cp\u003eThis book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June\/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog\/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.\u003c\/p\u003e","brand":"Gardners","offers":[{"title":"Default Title","offer_id":53589997486359,"sku":null,"price":11217.9,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0679\/6918\/8119\/files\/9789811074707.jpg?v=1782720792","url":"https:\/\/payment.letskitaboo.com\/te\/products\/vlsi-design-and-test-9789811074707","provider":"Kitaboo One eStore","version":"1.0","type":"link"}