{"product_id":"springerbriefs-in-applied-sciences-and-technology-9789811044335","title":"SpringerBriefs in Applied Sciences and Technology","description":"\u003cp\u003eThis book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes\/scanning- transmission electron microscopes (SEM\/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM\/-TEM) historically run at higher beam accelerating voltage\u003c\/p\u003e","brand":"Gardners","offers":[{"title":"Default Title","offer_id":53643722785047,"sku":null,"price":7505.95,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0679\/6918\/8119\/files\/9789811044335.jpg?v=1783497329","url":"https:\/\/payment.letskitaboo.com\/ur\/products\/springerbriefs-in-applied-sciences-and-technology-9789811044335","provider":"Kitaboo One eStore","version":"1.0","type":"link"}